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Cable Testers and Harness Testers Made Easy! |
| Bad connections caused by... | Countermeasure / Process Change |
Could be detected in tests as... | ||
| Open | Intermittent Open | High Resistance | ||
| Wire not connected, missing or connected to something else (miswire): | Guided assembly Learn more about Guided Assembly here and here. Pin-Sight Learn more about our Pin-Sight build aide. |
X | ||
| Flux on mating surface of contact | Learn more about flux on contact surfaces. |
X | X | X |
| Cold solder joint | IPC/WHMA 6-20 section 4.3 to 4.9 has excellent information on soldering. http://www.ipc.org To purchase a copy of A620 visit the WHMA website. |
X | X | X |
| Wire insulation caught in a crimp termination | Inspection and adjustment for cutting/stripping equipment including replacing stripping blades. |
X | X | X |
| Metal oxides on surface of joined metal parts including failure of gas tight connection | This can be a field problem that is difficult to test since the wiping action of connector engagement usually interrupts the problem for a short time. To learn more about this problem see: Dry Circuit Testing |
X | X | X |
| Deformed/damaged/worn contact: including fatigue in spring force of contact | Contacts in mating fixturing connectors that are identical or even undersized may help. Spring probes are blind to these faults. |
X | X | X |
| Failure of contact to fully mate because contact is not retained in connector housing | Contact Retention Problems See Push-Click-Pull Pin-Sight Learn more about Pin-Sight |
X | X | X |
| Wrong wire gauge for termination | Check manufactures specifications for terminals/pins against wire guage. Use a splice to change wire size. |
X | X | X |
| Loose crimps: including those caused by missing strands of wire | Crimp force monitoring, Crimp Pull Test: Crimp Size Chart |
X | X | X |
| All strands broken: (sometimes the result of excessive crimp force) | Crimp force monitoring, Crimp Pull Test: Crimp Size Chart |
X | X | X |
| Fixturing to the device under test has any of the problems above | X | X | X | |
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